Data-in-use leakages from Android memory - Test and analysis - researchr publication authors

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Pasquale Stirparo, Igor Nai Fovino, Ioannis Kounelis. Data-in-use leakages from Android memory - Test and analysis. In 9th IEEE International Conference on Wireless and Mobile Computing, Networking and Communications, WiMob 2013, Lyon, France, October 7-9, 2013. pages 701-708, IEEE, 2013. [doi]

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