Mile K. Stojcev. Rohit Kapur, CTL for Test Information of Digital ICs Hardcover. Kluwer Academic Publisher, Boston, 2003. pp 173, plus XI, ISBN 1-4020-7293-7. Microelectronics Reliability, 43(7):1171-1172, 2003. [doi]
@article{Stojcev03e,
title = {Rohit Kapur, CTL for Test Information of Digital ICs Hardcover. Kluwer Academic Publisher, Boston, 2003. pp 173, plus XI, ISBN 1-4020-7293-7},
author = {Mile K. Stojcev},
year = {2003},
doi = {10.1016/S0026-2714(03)00158-6},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00158-6},
tags = {testing},
researchr = {https://researchr.org/publication/Stojcev03e},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {7},
pages = {1171-1172},
}