Mile K. Stojcev. Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 178, plus XI, ISBN 1-4020-7235-X. Microelectronics Reliability, 44(3):547-548, 2004. [doi]
@article{Stojcev04c,
title = {Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 178, plus XI, ISBN 1-4020-7235-X},
author = {Mile K. Stojcev},
year = {2004},
doi = {10.1016/j.microrel.2003.12.010},
url = {http://dx.doi.org/10.1016/j.microrel.2003.12.010},
tags = {testing},
researchr = {https://researchr.org/publication/Stojcev04c},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {3},
pages = {547-548},
}