The following publications are possibly variants of this publication:
- Rohit Kapur, CTL for Test Information of Digital ICs Hardcover. Kluwer Academic Publisher, Boston, 2003. pp 173, plus XI, ISBN 1-4020-7293-7Mile K. Stojcev. mr, 43(7):1171-1172, 2003. [doi]
- Memory architecture exploration for programmable embedded systems; Peter Grun, Nikil Dutt, Alexandru Nicolau. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp 128, plus XVII, ISBN 1-4020-7324-0Mile K. Stojcev. mr, 44(7):1205-1206, 2004. [doi]
- Alfredo Benso, Paolo Prinetto, editors, Fault injection techniques and tools for embedded systems reliability and evaluation, Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 241, plus XIV, ISBN 1-4020-7589-8Mile K. Stojcev. mr, 46(8):1396-1397, 2006. [doi]