Mile K. Stojcev. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Said Hamdioui, Kluwer Academic Publishers, Boston, 2004, Hardcover, pp 221, plus XX, ISBN 1-4020-7752-1. Microelectronics Reliability, 45(5-6):1012-1013, 2005. [doi]
@article{Stojcev05e,
title = {Testing Static Random Access Memories: Defects, Fault Models and Test Patterns, Said Hamdioui, Kluwer Academic Publishers, Boston, 2004, Hardcover, pp 221, plus XX, ISBN 1-4020-7752-1},
author = {Mile K. Stojcev},
year = {2005},
doi = {10.1016/j.microrel.2004.11.003},
url = {http://dx.doi.org/10.1016/j.microrel.2004.11.003},
tags = {testing, random testing},
researchr = {https://researchr.org/publication/Stojcev05e},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {5-6},
pages = {1012-1013},
}