Alfredo Benso, Paolo Prinetto, editors, Fault injection techniques and tools for embedded systems reliability and evaluation, Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 241, plus XIV, ISBN 1-4020-7589-8 - researchr publication related

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Mile K. Stojcev. Alfredo Benso, Paolo Prinetto, editors, Fault injection techniques and tools for embedded systems reliability and evaluation, Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 241, plus XIV, ISBN 1-4020-7589-8. Microelectronics Reliability, 46(8):1396-1397, 2006. [doi]

The following publications are possibly variants of this publication:

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test; R. Dean Adams, Kluwer Academic Publishers, Boston, 2003, Hardcover, pp 247, plus XIII, ISBN 1-4020-7255-4Mile K. Stojcev. mr, 43(5):819, 2003. [doi]

Rohit Kapur, CTL for Test Information of Digital ICs Hardcover. Kluwer Academic Publisher, Boston, 2003. pp 173, plus XI, ISBN 1-4020-7293-7Mile K. Stojcev. mr, 43(7):1171-1172, 2003. [doi]

Memory architecture exploration for programmable embedded systems; Peter Grun, Nikil Dutt, Alexandru Nicolau. Kluwer Academic Publishers, Boston. 2003. Hardcover, pp 128, plus XVII, ISBN 1-4020-7324-0Mile K. Stojcev. mr, 44(7):1205-1206, 2004. [doi]

Power estimation and optimization for VLIW-based embedded systems; Vittorio Zaccaria, Mariagiovanna Sami, Donatella Sciuto, Cristina Silvano. Hardcover, pp 203, plus XXIV, Kluwer Academic Publishers, Boston, 2003. ISBN 1-4020-7377-1Mile K. Stojcev. mr, 44(4):707-708, 2004. [doi]

Memory Design Techniques for Low Energy Embedded Systems; Alberto Macii, Luca Benini, Massimo Poncino. Kluwer Academic Publishers, Boston, USA, 2002. Hard cover, pp 144 plus XI, ISBN 0-7923-7690-0Mile K. Stojcev. mr, 43(3):513, 2003. [doi]

System Design with System C; Thorsten Grotker, Stan Liao, Grant Martin, Stuart Swan. Kluwer Academic Publishers, Boston, 2002. Hardcover, pp 217, plus X, ISBN 1-4020-7027-1Mile K. Stojcev. mr, 43(4):683-684, 2003. [doi]

Networks on Chip; Axel Jantsch, Hannu Tenhunen (Eds.). Kluwer Academic Publishers, Boston; 2003. Hardcover, pp 303, plus VIII, ISBN 1-4020-7392-5Mile K. Stojcev. mr, 44(7):1203-1204, 2004. [doi]

Interconnecting and Computing over Satellite Networks; Yongguang Zhang (Ed.). Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 262, plus XXII, ISBN 1-4020-7424-7Mile K. Stojcev. mr, 44(2):363-364, 2004. [doi]

System on chip design languages; Anne Mignotte, Eugenio Villar, Lynn Horobin, editors, Kluwer Academic Publishers, Boston, 2002. Hardcover, pp 283, plus IX, ISBN 1-4020-7046-2Mile K. Stojcev. mr, 44(1):179, 2004. [doi]

A designer s guide to built-in self-test; Charles E. Stround. Kluwer Academic Publishers, Boston, 2002. Hardcover, pp 319, plus XVI, ISBN 1-4020-7050-0Mile K. Stojcev. mr, 43(3):514-515, 2003. [doi]

Vadim Ivanov, Igor Filanovsky, Operational Amplifier Speed and Accuracy Improvement: Analog Circuit Design with Structural Methodology, Kluwer Academic Publishers, Boston, 2004, Hardcover, pp 194, plus XIV, ISBN 1-4020-7772-6Mile K. Stojcev. mr, 45(2):407-408, 2005. [doi]

Design criteria for low distortion in feedback OPAMP circuits; Bjornar Hernes, Trond Saether, Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 160, plus XXV, ISBN 1-4020-7356-9Mile K. Stojcev. mr, 44(1):181-182, 2004. [doi]

Power-Constrained Testing of VLSI Circuits. Nikola Nikolici, Bashir M. Al-Hashimi. Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 178, plus XI, ISBN 1-4020-7235-XMile K. Stojcev. mr, 44(3):547-548, 2004. [doi]

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