The following publications are possibly variants of this publication:
- Rohit Kapur, CTL for Test Information of Digital ICs Hardcover. Kluwer Academic Publisher, Boston, 2003. pp 173, plus XI, ISBN 1-4020-7293-7Mile K. Stojcev. mr, 43(7):1171-1172, 2003. [doi]
- Interconnecting and Computing over Satellite Networks; Yongguang Zhang (Ed.). Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 262, plus XXII, ISBN 1-4020-7424-7Mile K. Stojcev. mr, 44(2):363-364, 2004. [doi]
- Gregory A. Matson, Tony R. Taylor, Julie N. Villar, Elements of STIL: Principles and Applications of IEEE Std. 1450, Kluwer Academic Publishers, Boston, 2003, Hardcover, pp 291, plus XIX, ISBN 1-4020-7637-1Mile K. Stojcev. mr, 45(12):1951-1952, 2005. [doi]
- Book review: Intellectual property protection in VLSI designs: Theory and practice, Hardcover, pp 183, plus XIX, Kluwer Academic Publishers, Boston, 2003, ISBN 1-4020-7320-8Gang Qu, Miodrag Potkonjak, Mile K. Stojcev. mr, 44(4):705-706, 2004. [doi]
- A designer s guide to built-in self-test; Charles E. Stround. Kluwer Academic Publishers, Boston, 2002. Hardcover, pp 319, plus XVI, ISBN 1-4020-7050-0Mile K. Stojcev. mr, 43(3):514-515, 2003. [doi]
- F. Mayer-Linderberg, Dedicated Digital Processors: Methods in Hardware/Software System Design, John Wiley & Sons, Ltd., Chichester (2004) ISBN 0-470-84444-2 Hardcover, pp 302, plus XIMile K. Stojcev. mr, 46(5-6):1025-1026, 2006. [doi]
- Digital Computer Arithmetic Datapath Design Using Verilog HDL, James E. Stine, Kluwer Academic Publishers, Boston, 2004, ISBN 1-4020-7710-6. Hardcover, pp 180, plus XIMile K. Stojcev. mr, 45(7-8):1272, 2005. [doi]
- High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test; R. Dean Adams, Kluwer Academic Publishers, Boston, 2003, Hardcover, pp 247, plus XIII, ISBN 1-4020-7255-4Mile K. Stojcev. mr, 43(5):819, 2003. [doi]