Giuseppe Stragapede, Rubén Vera-Rodríguez, Ruben Tolosana, Aythami Morales, Ivan DeAndres-Tame, Naser Damer, Julian Fiérrez, Javier Ortega-Garcia, Nahuel González, Andrei Shadrikov, Dmitrii Gordin, Leon Schmitt, Daniel Wimmer, Christoph Großmann, Joerdis Krieger, Florian Heinz, Ron Krestel, Christoffer Mayer, Simon Haberl, Helena Gschrey, Yosuke Yamagishi, Sanjay Saha, Sanka Rasnayaka, Sandareka Wickramanayake, Terence Sim, Weronika Gutfeter, Adam Baran, Mateusz Krzyszton, Przemyslaw Jaskola. IEEE BigData 2023 Keystroke Verification Challenge (KVC). In Jingrui He, Themis Palpanas, Xiaohua Hu, Alfredo Cuzzocrea, Dejing Dou, Dominik Slezak, Wei Wang, Aleksandra Gruca, Jerry Chun-Wei Lin, Rakesh Agrawal 0001, editors, IEEE International Conference on Big Data, BigData 2023, Sorrento, Italy, December 15-18, 2023. pages 6092-6100, IEEE, 2023. [doi]
@inproceedings{StragapedeVTMDDFOGSGSWGKHKMHGYS23,
title = {IEEE BigData 2023 Keystroke Verification Challenge (KVC)},
author = {Giuseppe Stragapede and Rubén Vera-Rodríguez and Ruben Tolosana and Aythami Morales and Ivan DeAndres-Tame and Naser Damer and Julian Fiérrez and Javier Ortega-Garcia and Nahuel González and Andrei Shadrikov and Dmitrii Gordin and Leon Schmitt and Daniel Wimmer and Christoph Großmann and Joerdis Krieger and Florian Heinz and Ron Krestel and Christoffer Mayer and Simon Haberl and Helena Gschrey and Yosuke Yamagishi and Sanjay Saha and Sanka Rasnayaka and Sandareka Wickramanayake and Terence Sim and Weronika Gutfeter and Adam Baran and Mateusz Krzyszton and Przemyslaw Jaskola},
year = {2023},
doi = {10.1109/BigData59044.2023.10386557},
url = {https://doi.org/10.1109/BigData59044.2023.10386557},
researchr = {https://researchr.org/publication/StragapedeVTMDDFOGSGSWGKHKMHGYS23},
cites = {0},
citedby = {0},
pages = {6092-6100},
booktitle = {IEEE International Conference on Big Data, BigData 2023, Sorrento, Italy, December 15-18, 2023},
editor = {Jingrui He and Themis Palpanas and Xiaohua Hu and Alfredo Cuzzocrea and Dejing Dou and Dominik Slezak and Wei Wang and Aleksandra Gruca and Jerry Chun-Wei Lin and Rakesh Agrawal 0001},
publisher = {IEEE},
isbn = {979-8-3503-2445-7},
}