Justin Strait, Sebastian Kurtek. Bayesian Model-Based Automatic Landmark Detection for Planar Curves. In 2016 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2016, Las Vegas, NV, USA, June 26 - July 1, 2016. pages 1041-1049, IEEE Computer Society, 2016. [doi]
@inproceedings{StraitK16,
title = {Bayesian Model-Based Automatic Landmark Detection for Planar Curves},
author = {Justin Strait and Sebastian Kurtek},
year = {2016},
doi = {10.1109/CVPRW.2016.134},
url = {http://doi.ieeecomputersociety.org/10.1109/CVPRW.2016.134},
researchr = {https://researchr.org/publication/StraitK16},
cites = {0},
citedby = {0},
pages = {1041-1049},
booktitle = {2016 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2016, Las Vegas, NV, USA, June 26 - July 1, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-1437-8},
}