Yield and Reliability Challenges at 7nm and Below - researchr publication authors

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Andrzej J. Strojwas, Kelvin Doong, Dennis J. Ciplickas. Yield and Reliability Challenges at 7nm and Below. In Andrzej Napieralksi, editor, 26th International Conference on Mixed Design of Integrated Circuits and Systems, MIXDES 2019, Rzeszów, Poland, June 27-29, 2019. pages 52-55, IEEE, 2019. [doi]

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