Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!) - researchr publication authors

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Charles E. Stroud, Srinivasa Konala, Ping Chen, Miron Abramovici. Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!). In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 387-392, IEEE Computer Society, 1996. [doi]

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