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Evaluating the quality of individual SIFT features

Hui Su, Wei-Hong Chuang, Wenjun Lu, Min Wu 0001. Evaluating the quality of individual SIFT features. In 19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012. pages 2377-2380, IEEE, 2012. [doi]

Authors

Hui Su

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Wei-Hong Chuang

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Wenjun Lu

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Min Wu 0001

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