Multiple path sensitization for hierarchical circuit testing

Chau-chin Su, Charles R. Kime. Multiple path sensitization for hierarchical circuit testing. In Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. pages 152-161, IEEE Computer Society, 1990. [doi]

Authors

Chau-chin Su

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Charles R. Kime

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