Chun Su, Le Li, Zejun Wen. Remaining useful life prediction via a variational autoencoder and a time-window-based sequence neural network. Quality and Reliability Eng. Int., 36(5):1639-1656, 2020. [doi]
@article{SuLW20-1,
title = {Remaining useful life prediction via a variational autoencoder and a time-window-based sequence neural network},
author = {Chun Su and Le Li and Zejun Wen},
year = {2020},
doi = {10.1002/qre.2651},
url = {https://doi.org/10.1002/qre.2651},
researchr = {https://researchr.org/publication/SuLW20-1},
cites = {0},
citedby = {0},
journal = {Quality and Reliability Eng. Int.},
volume = {36},
number = {5},
pages = {1639-1656},
}