Lei Su, Tielin Shi, Li Du, Xiangning Lu, Guanglan Liao. Genetic algorithms for defect detection of flip chips. Microelectronics Reliability, 55(1):213-220, 2015. [doi]
@article{SuSDLL15,
title = {Genetic algorithms for defect detection of flip chips},
author = {Lei Su and Tielin Shi and Li Du and Xiangning Lu and Guanglan Liao},
year = {2015},
doi = {10.1016/j.microrel.2014.09.006},
url = {http://dx.doi.org/10.1016/j.microrel.2014.09.006},
researchr = {https://researchr.org/publication/SuSDLL15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {1},
pages = {213-220},
}