Product Surface Defect Detection Based on CNN Ensemble with Rejection - researchr publication authors

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Kai Su, Qiangfu Zhao, Po Chun Lien. Product Surface Defect Detection Based on CNN Ensemble with Rejection. In 2019 IEEE Intl Conf on Dependable, Autonomic and Secure Computing, Intl Conf on Pervasive Intelligence and Computing, Intl Conf on Cloud and Big Data Computing, Intl Conf on Cyber Science and Technology Congress, DASC/PiCom/CBDCom/CyberSciTech 2019, Fukuoka, Japan, August 5-8, 2019. pages 326-331, IEEE, 2019. [doi]

This author has not been identified. Look up 'Kai Su' in GoogleThis author has not been identified. Look up 'Qiangfu Zhao' in GoogleThis author has not been identified. Look up 'Po Chun Lien' in Google

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