Image Patch Similarity Through a Meta-Learning Metric Based Approach

Patricia L. Suárez, Ángel D. Sappa, Boris Xavier Vintimilla. Image Patch Similarity Through a Meta-Learning Metric Based Approach. In 15th International Conference on Signal-Image Technology & Internet-Based Systems, SITIS 2019, Sorrento, Italy, November 26-29, 2019. pages 511-517, IEEE, 2019. [doi]

Authors

Patricia L. Suárez

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Ángel D. Sappa

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Boris Xavier Vintimilla

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