Pablo Suau, Francisco Escolano. Entropy Estimation and Multi-Dimensional Scale Saliency. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 678-681, IEEE, 2010. [doi]
@inproceedings{SuauE10,
title = {Entropy Estimation and Multi-Dimensional Scale Saliency},
author = {Pablo Suau and Francisco Escolano},
year = {2010},
doi = {10.1109/ICPR.2010.171},
url = {http://dx.doi.org/10.1109/ICPR.2010.171},
researchr = {https://researchr.org/publication/SuauE10},
cites = {0},
citedby = {0},
pages = {678-681},
booktitle = {20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010},
publisher = {IEEE},
}