Ultra-thin Gate Oxide Reliability and Implications for Design (Tutorial Abstract) - researchr publication bibtex

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John S. Suehle. Ultra-thin Gate Oxide Reliability and Implications for Design (Tutorial Abstract). In ISQED. pages 9, 2002. [doi]

@inproceedings{Suehle02,
  title = {Ultra-thin Gate Oxide Reliability and Implications for Design (Tutorial Abstract)},
  author = {John S. Suehle},
  year = {2002},
  url = {http://computer.org/proceedings/isqed/1561/15610009.pdf},
  tags = {reliability, design},
  researchr = {https://researchr.org/publication/Suehle02},
  cites = {0},
  citedby = {0},
  pages = {9},
  booktitle = {ISQED},
}

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