Sufatrio, Roland H. C. Yap. Quantifying the Effects of More Timely Certificate Revocation on Lightweight Mobile Devices. In James Walden, Laurie Williams, editors, Third International Workshop on Security Measurements and Metrics, Metrisec@ESEM 2011, Banff, Alberta, Canada, September 21, 2011. pages 31-40, IEEE, 2011. [doi]
@inproceedings{SufatrioY11-0,
title = {Quantifying the Effects of More Timely Certificate Revocation on Lightweight Mobile Devices},
author = {Sufatrio and Roland H. C. Yap},
year = {2011},
doi = {10.1109/Metrisec.2011.17},
url = {https://doi.org/10.1109/Metrisec.2011.17},
researchr = {https://researchr.org/publication/SufatrioY11-0},
cites = {0},
citedby = {0},
pages = {31-40},
booktitle = {Third International Workshop on Security Measurements and Metrics, Metrisec@ESEM 2011, Banff, Alberta, Canada, September 21, 2011},
editor = {James Walden and Laurie Williams},
publisher = {IEEE},
isbn = {978-1-4673-1245-5},
}