Takeshi Sugawara, Daisuke Suzuki, Toshihiro Katashita. Circuit Simulation for Fault Sensitivity Analysis and Its Application to Cryptographic LSI. In Guido Bertoni, Benedikt Gierlichs, editors, 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, Leuven, Belgium, September 9, 2012. pages 16-23, IEEE, 2012. [doi]
@inproceedings{SugawaraSK12,
title = {Circuit Simulation for Fault Sensitivity Analysis and Its Application to Cryptographic LSI},
author = {Takeshi Sugawara and Daisuke Suzuki and Toshihiro Katashita},
year = {2012},
doi = {10.1109/FDTC.2012.17},
url = {http://dx.doi.org/10.1109/FDTC.2012.17},
researchr = {https://researchr.org/publication/SugawaraSK12},
cites = {0},
citedby = {0},
pages = {16-23},
booktitle = {2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, Leuven, Belgium, September 9, 2012},
editor = {Guido Bertoni and Benedikt Gierlichs},
publisher = {IEEE},
isbn = {978-1-4673-2900-2},
}