Exploiting Bitflip Detector for Non-invasive Probing and its Application to Ineffective Fault Analysis

Takeshi Sugawara, Natsu Shoji, Kazuo Sakiyama, Kohei Matsuda, Noriyuki Miura, Makoto Nagata. Exploiting Bitflip Detector for Non-invasive Probing and its Application to Ineffective Fault Analysis. In 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2017, Taipei, Taiwan, September 25, 2017. pages 49-56, IEEE Computer Society, 2017. [doi]

@inproceedings{SugawaraSSMMN17,
  title = {Exploiting Bitflip Detector for Non-invasive Probing and its Application to Ineffective Fault Analysis},
  author = {Takeshi Sugawara and Natsu Shoji and Kazuo Sakiyama and Kohei Matsuda and Noriyuki Miura and Makoto Nagata},
  year = {2017},
  doi = {10.1109/FDTC.2017.17},
  url = {http://doi.ieeecomputersociety.org/10.1109/FDTC.2017.17},
  researchr = {https://researchr.org/publication/SugawaraSSMMN17},
  cites = {0},
  citedby = {0},
  pages = {49-56},
  booktitle = {2017 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2017, Taipei, Taiwan, September 25, 2017},
  publisher = {IEEE Computer Society},
  isbn = {978-1-5386-2948-2},
}