Mitsutoshi Sugawara, Zule Xu, Akira Matsuzawa. Physical-Weight-Based Measurement Methodology Suppressing Noise or Reducing Test Time for High-Resolution Low-Speed ADCs. IEICE Transactions, 100-C(6):576-583, 2017. [doi]
@article{SugawaraXM17,
title = {Physical-Weight-Based Measurement Methodology Suppressing Noise or Reducing Test Time for High-Resolution Low-Speed ADCs},
author = {Mitsutoshi Sugawara and Zule Xu and Akira Matsuzawa},
year = {2017},
url = {http://search.ieice.org/bin/summary.php?id=e100-c_6_576},
researchr = {https://researchr.org/publication/SugawaraXM17},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {100-C},
number = {6},
pages = {576-583},
}