PHYS: Profiled-HYbrid Sampling for soft error reliability benchmarking

Jinho Suh, Murali Annavaram, Michel Dubois. PHYS: Profiled-HYbrid Sampling for soft error reliability benchmarking. In 2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), Budapest, Hungary, June 24-27, 2013. pages 1-12, IEEE, 2013. [doi]

@inproceedings{SuhAD13,
  title = {PHYS: Profiled-HYbrid Sampling for soft error reliability benchmarking},
  author = {Jinho Suh and Murali Annavaram and Michel Dubois},
  year = {2013},
  doi = {10.1109/DSN.2013.6575352},
  url = {http://doi.ieeecomputersociety.org/10.1109/DSN.2013.6575352},
  researchr = {https://researchr.org/publication/SuhAD13},
  cites = {0},
  citedby = {0},
  pages = {1-12},
  booktitle = {2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), Budapest, Hungary, June 24-27, 2013},
  publisher = {IEEE},
  isbn = {978-1-4673-6471-3},
}