Sungho Suh, Paul Lukowicz, Yong Oh Lee. Fusion of Global-Local Features for Image Quality Inspection of Shipping Label. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 2643-2649, IEEE, 2020. [doi]
@inproceedings{SuhLL20-1,
title = {Fusion of Global-Local Features for Image Quality Inspection of Shipping Label},
author = {Sungho Suh and Paul Lukowicz and Yong Oh Lee},
year = {2020},
doi = {10.1109/ICPR48806.2021.9413111},
url = {https://doi.org/10.1109/ICPR48806.2021.9413111},
researchr = {https://researchr.org/publication/SuhLL20-1},
cites = {0},
citedby = {0},
pages = {2643-2649},
booktitle = {25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021},
publisher = {IEEE},
isbn = {978-1-7281-8808-9},
}