Ephraim Suhir. Could electronics reliability be predicted, quantified and assured?. Microelectronics Reliability, 53(7):925-936, 2013. [doi]
@article{Suhir13,
title = {Could electronics reliability be predicted, quantified and assured?},
author = {Ephraim Suhir},
year = {2013},
doi = {10.1016/j.microrel.2013.03.011},
url = {http://dx.doi.org/10.1016/j.microrel.2013.03.011},
researchr = {https://researchr.org/publication/Suhir13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {7},
pages = {925-936},
}