Tomás Suk, Jan Flusser. Combined blur and affine moment invariants and their use in pattern recognition. Pattern Recognition, 36(12):2895-2907, 2003. [doi]
@article{SukF03,
title = {Combined blur and affine moment invariants and their use in pattern recognition},
author = {Tomás Suk and Jan Flusser},
year = {2003},
doi = {10.1016/S0031-3203(03)00187-0},
url = {http://dx.doi.org/10.1016/S0031-3203(03)00187-0},
researchr = {https://researchr.org/publication/SukF03},
cites = {0},
citedby = {0},
journal = {Pattern Recognition},
volume = {36},
number = {12},
pages = {2895-2907},
}