Automatic Validation Test Generation Using Extracted Control Models

Robert W. Sumners, Jayanta Bhadra, Jacob A. Abraham. Automatic Validation Test Generation Using Extracted Control Models. In 13th International Conference on VLSI Design (VLSI Design 2000), 4-7 January 2000, Calcutta, India. pages 312, IEEE Computer Society, 2000. [doi]

Authors

Robert W. Sumners

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Jayanta Bhadra

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Jacob A. Abraham

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