Bing Sun, Jun Sun 0001, Long H. Pham, Tie Shi. Causality-Based Neural Network Repair. In 44th IEEE/ACM 44th International Conference on Software Engineering, ICSE 2022, Pittsburgh, PA, USA, May 25-27, 2022. pages 338-349, IEEE, 2022. [doi]
@inproceedings{Sun0PS22,
title = {Causality-Based Neural Network Repair},
author = {Bing Sun and Jun Sun 0001 and Long H. Pham and Tie Shi},
year = {2022},
doi = {10.1145/3510003.3510080},
url = {https://doi.org/10.1145/3510003.3510080},
researchr = {https://researchr.org/publication/Sun0PS22},
cites = {0},
citedby = {0},
pages = {338-349},
booktitle = {44th IEEE/ACM 44th International Conference on Software Engineering, ICSE 2022, Pittsburgh, PA, USA, May 25-27, 2022},
publisher = {IEEE},
isbn = {978-1-4503-9221-1},
}