Automatic generation of functional models for embedded processor extensions

Fei Sun. Automatic generation of functional models for embedded processor extensions. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 304-307, IEEE, 2012. [doi]

@inproceedings{Sun12-5,
  title = {Automatic generation of functional models for embedded processor extensions},
  author = {Fei Sun},
  year = {2012},
  url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6176484},
  researchr = {https://researchr.org/publication/Sun12-5},
  cites = {0},
  citedby = {0},
  pages = {304-307},
  booktitle = {2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012},
  editor = {Wolfgang Rosenstiel and Lothar Thiele},
  publisher = {IEEE},
  isbn = {978-1-4577-2145-8},
}