Chen Sun, Liang Gao 0001, Xinyu Li 0001, Pai Zheng, Yiping Gao. An Incremental Knowledge Learning Framework for Continuous Defect Detection. IEEE T. Instrumentation and Measurement, 73:1-11, 2024. [doi]
@article{SunGLZG24,
title = {An Incremental Knowledge Learning Framework for Continuous Defect Detection},
author = {Chen Sun and Liang Gao 0001 and Xinyu Li 0001 and Pai Zheng and Yiping Gao},
year = {2024},
doi = {10.1109/TIM.2023.3343768},
url = {https://doi.org/10.1109/TIM.2023.3343768},
researchr = {https://researchr.org/publication/SunGLZG24},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {73},
pages = {1-11},
}