Shupeng Sun, Xin Li. Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space. In The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015. pages 302-307, IEEE, 2015. [doi]
@inproceedings{SunL15-1,
title = {Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space},
author = {Shupeng Sun and Xin Li},
year = {2015},
doi = {10.1109/ASPDAC.2015.7059022},
url = {http://dx.doi.org/10.1109/ASPDAC.2015.7059022},
researchr = {https://researchr.org/publication/SunL15-1},
cites = {0},
citedby = {0},
pages = {302-307},
booktitle = {The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7792-5},
}