A study on IGBT junction temperature (Tj) online estimation using gate-emitter voltage (Vge) at turn-off

Vinoth K. Sundaramoorthy, E. Bianda, R. Bloch, Daniele Angelosante, I. Nistor, G. J. Riedel, F. Zurfluh, G. Knapp, A. Heinemann. A study on IGBT junction temperature (Tj) online estimation using gate-emitter voltage (Vge) at turn-off. Microelectronics Reliability, 54(11):2423-2431, 2014. [doi]

Authors

Vinoth K. Sundaramoorthy

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E. Bianda

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R. Bloch

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Daniele Angelosante

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I. Nistor

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G. J. Riedel

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F. Zurfluh

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G. Knapp

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A. Heinemann

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