Stephen K. Sunter. Testing High Frequency ADCs and DACs with a Low Frequency Analog Bus. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 228-235, IEEE Computer Society, 2003. [doi]
@inproceedings{Sunter03, title = {Testing High Frequency ADCs and DACs with a Low Frequency Analog Bus}, author = {Stephen K. Sunter}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630228abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/Sunter03}, cites = {0}, citedby = {0}, pages = {228-235}, booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA}, publisher = {IEEE Computer Society}, isbn = {0-7803-8106-8}, }