Stephen Sunter, Krzysztof Jurga, Peter Dingenen, Ronny Vanhooren. Practical random sampling of potential defects for analog fault simulation. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-10, IEEE, 2014. [doi]
@inproceedings{SunterJDV14, title = {Practical random sampling of potential defects for analog fault simulation}, author = {Stephen Sunter and Krzysztof Jurga and Peter Dingenen and Ronny Vanhooren}, year = {2014}, doi = {10.1109/TEST.2014.7035281}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035281}, researchr = {https://researchr.org/publication/SunterJDV14}, cites = {0}, citedby = {0}, pages = {1-10}, booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014}, publisher = {IEEE}, isbn = {978-1-4799-4722-5}, }