Yagiz Sutcu, Shantanu Rane, Jonathan S. Yedidia, Stark C. Draper, Anthony Vetro. Feature transformation of biometric templates for secure biometric systems based on error correcting codes. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2008, Anchorage, AK, USA, 23-28 June, 2008. pages 1-6, IEEE, 2008. [doi]
@inproceedings{SutcuRYDV08-0,
title = {Feature transformation of biometric templates for secure biometric systems based on error correcting codes},
author = {Yagiz Sutcu and Shantanu Rane and Jonathan S. Yedidia and Stark C. Draper and Anthony Vetro},
year = {2008},
doi = {10.1109/CVPRW.2008.4563111},
url = {http://doi.ieeecomputersociety.org/10.1109/CVPRW.2008.4563111},
researchr = {https://researchr.org/publication/SutcuRYDV08-0},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2008, Anchorage, AK, USA, 23-28 June, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2340-8},
}