Patchara Sutthiwan, Yun Q. Shi, Wei Su, Tian-Tsong Ng. Rake transform and edge statistics for image forgery detection. In Proceedings of the 2010 IEEE International Conference on Multimedia and Expo, ICME 2010, 19-23 July 2010, Singapore. pages 1463-1468, IEEE, 2010. [doi]
@inproceedings{SutthiwanSSN10,
title = {Rake transform and edge statistics for image forgery detection},
author = {Patchara Sutthiwan and Yun Q. Shi and Wei Su and Tian-Tsong Ng},
year = {2010},
doi = {10.1109/ICME.2010.5583264},
url = {http://dx.doi.org/10.1109/ICME.2010.5583264},
researchr = {https://researchr.org/publication/SutthiwanSSN10},
cites = {0},
citedby = {0},
pages = {1463-1468},
booktitle = {Proceedings of the 2010 IEEE International Conference on Multimedia and Expo, ICME 2010, 19-23 July 2010, Singapore},
publisher = {IEEE},
}