A New Short-Bar Method for 4TP Admittance Standards Calibration by Using a Modified Z-Matrix Expression to Improve Signal-to-Noise Ratio (S/N) for Higher Impedances

K. Suzuki. A New Short-Bar Method for 4TP Admittance Standards Calibration by Using a Modified Z-Matrix Expression to Improve Signal-to-Noise Ratio (S/N) for Higher Impedances. IEEE T. Instrumentation and Measurement, 58(4):980-984, 2009. [doi]

@article{Suzuki09-7,
  title = {A New Short-Bar Method for 4TP Admittance Standards Calibration by Using a Modified Z-Matrix Expression to Improve Signal-to-Noise Ratio (S/N) for Higher Impedances},
  author = {K. Suzuki},
  year = {2009},
  doi = {10.1109/TIM.2008.2006958},
  url = {http://dx.doi.org/10.1109/TIM.2008.2006958},
  researchr = {https://researchr.org/publication/Suzuki09-7},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {58},
  number = {4},
  pages = {980-984},
}