Henry Swofford, Ted Vosk. Metrology applied to forensic pattern evidence domains - A call for more forensic science metrology principles. IEEE Instrum. Meas. Mag., 20(1):15-19, 2017. [doi]
@article{SwoffordV17,
title = {Metrology applied to forensic pattern evidence domains - A call for more forensic science metrology principles},
author = {Henry Swofford and Ted Vosk},
year = {2017},
doi = {10.1109/MIM.2017.7864544},
url = {http://dx.doi.org/10.1109/MIM.2017.7864544},
researchr = {https://researchr.org/publication/SwoffordV17},
cites = {0},
citedby = {0},
journal = {IEEE Instrum. Meas. Mag.},
volume = {20},
number = {1},
pages = {15-19},
}