Automatic Test Data Generation for Programs with Integer and Float Variables

Nguyen Tran Sy, Yves Deville. Automatic Test Data Generation for Programs with Integer and Float Variables. In 16th IEEE International Conference on Automated Software Engineering (ASE 2001), 26-29 November 2001, Coronado Island, San Diego, CA, USA. pages 13-21, IEEE Computer Society, 2001. [doi]

Authors

Nguyen Tran Sy

This author has not been identified. Look up 'Nguyen Tran Sy' in Google

Yves Deville

This author has not been identified. Look up 'Yves Deville' in Google