Consistency techniques for interprocedural test data generation

Nguyen Tran Sy, Yves Deville. Consistency techniques for interprocedural test data generation. In Proceedings of the 11th ACM SIGSOFT Symposium on Foundations of Software Engineering 2003 held jointly with 9th European Software Engineering Conference, ESEC/FSE 2003, Helsinki, Finland, September 1-5, 2003. pages 108-117, ACM, 2003. [doi]

Authors

Nguyen Tran Sy

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Yves Deville

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