Testing and Verification of the Deep Neural Networks Against Sparse Pixel Defects

Michal Szczepankiewicz, Krystian Radlak, Karolina Szczepankiewicz, Adam Popowicz, Pawel Zawistowski. Testing and Verification of the Deep Neural Networks Against Sparse Pixel Defects. In Mario Trapp, Erwin Schoitsch, Jérémie Guiochet, Friedemann Bitsch, editors, Computer Safety, Reliability, and Security. SAFECOMP 2022 Workshops - DECSoS, DepDevOps, SASSUR, SENSEI, USDAI, and WAISE, Munich, Germany, September 6-9, 2022, Proceedings. Volume 13415 of Lecture Notes in Computer Science, pages 71-82, Springer, 2022. [doi]

@inproceedings{Szczepankiewicz22,
  title = {Testing and Verification of the Deep Neural Networks Against Sparse Pixel Defects},
  author = {Michal Szczepankiewicz and Krystian Radlak and Karolina Szczepankiewicz and Adam Popowicz and Pawel Zawistowski},
  year = {2022},
  doi = {10.1007/978-3-031-14862-0_4},
  url = {https://doi.org/10.1007/978-3-031-14862-0_4},
  researchr = {https://researchr.org/publication/Szczepankiewicz22},
  cites = {0},
  citedby = {0},
  pages = {71-82},
  booktitle = {Computer Safety, Reliability, and Security. SAFECOMP 2022 Workshops - DECSoS, DepDevOps, SASSUR, SENSEI, USDAI, and WAISE, Munich, Germany, September 6-9, 2022, Proceedings},
  editor = {Mario Trapp and Erwin Schoitsch and Jérémie Guiochet and Friedemann Bitsch},
  volume = {13415},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-031-14862-0},
}