Scan-based attack tolerance with minimum testability loss: a gate-level approach

Mohammad Taherifard, Mahdi Fazeli, Ahmad Patooghy. Scan-based attack tolerance with minimum testability loss: a gate-level approach. IET Information Security, 14(4):459-469, 2020. [doi]

Authors

Mohammad Taherifard

This author has not been identified. Look up 'Mohammad Taherifard' in Google

Mahdi Fazeli

This author has not been identified. Look up 'Mahdi Fazeli' in Google

Ahmad Patooghy

This author has not been identified. Look up 'Ahmad Patooghy' in Google