Mehdi Baradaran Tahoori. Diagnosis of open defects in FPGA interconnect. In Proceedings of the 2002 IEEE International Conference on Field-Programmable Technology, FPT 2002, Hong Kong, China, December 16-18, 2002. pages 328-331, IEEE, 2002. [doi]
@inproceedings{Tahoori02,
title = {Diagnosis of open defects in FPGA interconnect},
author = {Mehdi Baradaran Tahoori},
year = {2002},
doi = {10.1109/FPT.2002.1188703},
url = {http://dx.doi.org/10.1109/FPT.2002.1188703},
researchr = {https://researchr.org/publication/Tahoori02},
cites = {0},
citedby = {0},
pages = {328-331},
booktitle = {Proceedings of the 2002 IEEE International Conference on Field-Programmable Technology, FPT 2002, Hong Kong, China, December 16-18, 2002},
publisher = {IEEE},
isbn = {0-7803-7574-2},
}