Binary Similarity Analysis for Vulnerability Detection

Zeming Tai, Hironori Washizaki, Yoshiaki Fukazawa, Yurie Fujimatsu, Jun Kanai. Binary Similarity Analysis for Vulnerability Detection. In 44th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2020, Madrid, Spain, July 13-17, 2020. pages 1121-1122, IEEE, 2020. [doi]

Authors

Zeming Tai

This author has not been identified. Look up 'Zeming Tai' in Google

Hironori Washizaki

This author has not been identified. Look up 'Hironori Washizaki' in Google

Yoshiaki Fukazawa

This author has not been identified. Look up 'Yoshiaki Fukazawa' in Google

Yurie Fujimatsu

This author has not been identified. Look up 'Yurie Fujimatsu' in Google

Jun Kanai

This author has not been identified. Look up 'Jun Kanai' in Google