Fast and Robust Single-Exponential Decay Recovery From Noisy Fluorescence Lifetime Imaging - researchr publication authors

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Ali Taimori, Duncan Humphries, Gareth O. S. Williams, Kevin Dhaliwal, Neil Finlayson, James R. Hopgood. Fast and Robust Single-Exponential Decay Recovery From Noisy Fluorescence Lifetime Imaging. IEEE Trans. Biomed. Engineering, 69(12):3703-3716, 2022. [doi]

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