Shogo Takahashi, Kazuteru Namba. A Double Node Upset tolerant SR latch using C-element. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022. pages 101-102, IEEE, 2022. [doi]
@inproceedings{TakahashiN22-0,
title = {A Double Node Upset tolerant SR latch using C-element},
author = {Shogo Takahashi and Kazuteru Namba},
year = {2022},
doi = {10.1109/ICCE-Taiwan55306.2022.9869196},
url = {https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869196},
researchr = {https://researchr.org/publication/TakahashiN22-0},
cites = {0},
citedby = {0},
pages = {101-102},
booktitle = {IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7050-6},
}