Sriraman Tallam, Neelam Gupta. A concept analysis inspired greedy algorithm for test suite minimization. In Michael D. Ernst, Thomas P. Jensen, editors, Proceedings of the 2005 ACM SIGPLAN-SIGSOFT Workshop on Program Analysis For Software Tools and Engineering, PASTE 05, Lisbon, Portugal, September 5-6, 2005. pages 35-42, ACM, 2005. [doi]
@inproceedings{TallamG05,
title = {A concept analysis inspired greedy algorithm for test suite minimization},
author = {Sriraman Tallam and Neelam Gupta},
year = {2005},
doi = {10.1145/1108792.1108802},
url = {http://doi.acm.org/10.1145/1108792.1108802},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/TallamG05},
cites = {0},
citedby = {0},
pages = {35-42},
booktitle = {Proceedings of the 2005 ACM SIGPLAN-SIGSOFT Workshop on Program Analysis For Software Tools and Engineering, PASTE 05, Lisbon, Portugal, September 5-6, 2005},
editor = {Michael D. Ernst and Thomas P. Jensen},
publisher = {ACM},
isbn = {1-59593-239-9},
}