Wing-Shan Tam, Chi-Wah Kok, Sik-Lam Siu, Hei Wong. Snapback breakdown ESD device based on zener diodes on silicon-on-insulator technology. Microelectronics Reliability, 54(6-7):1163-1168, 2014. [doi]
@article{TamKSW14,
title = {Snapback breakdown ESD device based on zener diodes on silicon-on-insulator technology},
author = {Wing-Shan Tam and Chi-Wah Kok and Sik-Lam Siu and Hei Wong},
year = {2014},
doi = {10.1016/j.microrel.2014.01.014},
url = {http://dx.doi.org/10.1016/j.microrel.2014.01.014},
researchr = {https://researchr.org/publication/TamKSW14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {6-7},
pages = {1163-1168},
}