Regression Test Generation by Usage Coverage Driven Clustering on User Traces

Frédéric Tamagnan, Fabrice Bouquet, Alexandre Vernotte, Bruno Legeard. Regression Test Generation by Usage Coverage Driven Clustering on User Traces. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2023 - Workshops, Dublin, Ireland, April 16-20, 2023. pages 82-89, IEEE, 2023. [doi]

Authors

Frédéric Tamagnan

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Fabrice Bouquet

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Alexandre Vernotte

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Bruno Legeard

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